Electronic & Electrochemical Materials

GORE™ G410 Prepreg


GORE G410 Prepreg

GORE G410 Prepreg allows production of reliable, high performance, single-chip substrate packages using modified printed circuit board construction techniques. GORE G410 Prepreg delivers the high performance organic substrate at a reasonable cost.



Typical Material Properties

Property Method Value*

Dielectric constant 500 MHz

Split post resonant cavity

3.4

10 GHz

Kent cavity

3.4

40 GHz

DI Model 600T Open Resonator

3.3

Loss tangent 500 MHz

Split post resonant cavity

0.008

10 GHz

Kent cavity

0.008

40 GHz

DI Model 600T Open Resonator

0.008

Glass transition temperature (Tg)

TMA

220°C

Coefficient of thermal expansion (CTE )

TMA (–55 to +125°C)

19 ppm/°C (X, Y, Z)

Thermal conductivity

(–67 to +257°F)

ASTM E1530 at 20°C (68°F)

0.46 W/mK

Flammability

UL

94 V-0**

Tensile modulus

at 25°C (77°F)

12.2 GPa

Moisture absorption

24-hr. immersion, 20° C

0.17 % w/w

Peel strength

IPC TM650 Method 2.4.9

17 µm copper (1/2 oz)

0.6 Kg/cm

Pressed thickness

IPC TM650 Method 2.4.38

63 μm

* Typical properties are not specification limits, but nominal performance values
** Tested to UL flammability requirements by an independent lab


Substrate Reliability Information

Item Test Method Condition Result

Preconditioning

JEDEC JESD22-A113A Level 3

30°C; 60% RH; followed by 3 reflows at 225°C

Pass

Thermal shock

JESD22-A106A Condition C

15 cycles; –55°C to +125°C; liquid-to-liquid

Pass

Thermal cycling

JESD22-A104A Condition B

3,000 cycles; –55°C to +125°C; air-to-air

Pass

Pressure cooker test

JEDEC JESD22-A102B

168 hrs; 15 psig; 121°C

Pass

High temperature storage

JESD22-A103A

150°C; 1,000 hrs

Pass

Temperature humidity bias (THB)

JEDEC JESD22-A101A

85°C; 85% RH; 1,000 hrs; 5 V bias

Pass

Solderability

MIL-STD-883 Method 2003

8 hrs steam aging; followed by immersion in solder

Pass

HAST

JESD22-A110A

130°C; 85% RH; 5 V; 96 hrs

Pass


Advantages

  • Excellent dimensional stability for fine line processing
  • Stable Dk and Df over a wide frequency range
  • CTE matched to copper in X, Y, and Z-axis, allowing high aspect ratio vias
  • Superior thickness control for superior power distribution impedance
  • Proven moisture reliability
  • High Tg (225°C)
  • Processes with standard PWB techniques